1. Gradient Boosting-Accelerated Evolution for Multiple-Fault Diagnosis;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
2. A Deterministic-Statistical Multiple-Defect Diagnosis Methodology;2020 IEEE 38th VLSI Test Symposium (VTS);2020-04
3. PADLOC: Physically-Aware Defect Localization and Characterization;2017 IEEE 26th Asian Test Symposium (ATS);2017-11
4. Symptomatic Bug Localization for Functional Debug of Hardware Designs;2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID);2016-01
5. Automating Data Analysis and Acquisition Setup in a Silicon Debug Environment;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2012-06