Author:
Camurati P.,Medina D.,Prinetto P.,Sonza Reorda M.
Cited by
44 articles.
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1. A Storage Based LBIST Scheme for Logic Diagnosis;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. New Targets for Diagnostic Test Generation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
3. HYFII: HYbrid Fault Injection Infrastructure for Accurate Runtime System Failure Analysis;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2020-08
4. An Efficient Diagnosis-Aware ATPG Procedure to Enhance Diagnosis Resolution and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-09
5. Diagnostic Test Generation That Addresses Diagnostic Holes;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-02