Author:
Ternullo L.,Adams R.D.,Connor J.,Koch G.S.
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Design-for-Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
2. A Built-In Self-Testing Method for Embedded Multiport Memory Arrays;IEEE Transactions on Instrumentation and Measurement;2005-10
3. An efficient BIST method for non-traditional faults of embedded memory arrays;IEEE Transactions on Instrumentation and Measurement;2003-10
4. An efficient BIST method for distributed small buffers;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2002-08
5. A scheme for multiple on-chip signature checking for embedded SRAMS;Journal of Systems Architecture;2000-01