Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits-Reference-Cited by-同舟云学术

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Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits

Published: Issue: Volume: Page:
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Container-title:Proceedings International Test Conference 1997
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Author:

Arabi K.,Kaminska B.

Publisher

Int. Test Conference

Link

http://xplorestaging.ieee.org/ielx3/5033/13797/00639692.pdf?arnumber=639692

Cited by 47 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Total Irradiated Dose Measurement Using N-MOST Based Oscillator;2021 IEEE URUCON;2021-11-24

2. Analogue Integrated Circuits Design-for-Testability Flow Oriented onto OBIST Strategy;Information Technology And Control;2018-09-26

3. Look up Table Based Low Power Analog Circuit Testing;International Journal of Engineering;2016-09

4. A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs;Journal of Electronic Testing;2016-07-11

5. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14

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