1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
2. Parallel Static Learning Toward Heterogeneous Computing Architectures;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023
3. Scalable Parallel Static Learning;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18
4. Special Session – Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits;2021 IEEE 39th VLSI Test Symposium (VTS);2021-04-25
5. Chapter 9. Preprocessing in SAT Solving;Frontiers in Artificial Intelligence and Applications;2021-02-02