Scan chain design for test time reduction in core-based ICs-Reference-Cited by-同舟云学术

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Scan chain design for test time reduction in core-based ICs

Published: Issue: Volume: Page:
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Container-title:Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
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Author:

Aerts J.,Marinissen E.J.

Publisher

Int. Test Conference

Link

http://xplorestaging.ieee.org/ielx4/5947/15907/00743185.pdf?arnumber=743185

Cited by 104 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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