Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
24 articles.
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1. Shaping Test Inputs in Grammar-Based Fuzzing;Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis;2024-09-11
2. Parametric WCET as a function of procedure arguments: Analysis and applications;Journal of Systems Architecture;2024-03
3. WCET analysis with procedure arguments as parameters;The 31st International Conference on Real-Time Networks and Systems;2023-06-07
4. Reducing WCET Overestimations by Correcting Errors in Loop Bound Constraints;Energies;2017-12-12
5. Parametric Utilization Bounds;Techniques for Building Timing-Predictable Embedded Systems;2016