Author:
leFebre A.J.,Siekman M.,Abelmann L.,Lodder J.C.
Cited by
2 articles.
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1. Thermal Characteristics of Modulation Gate in Cold Cathode X-ray Source;2023 24th International Vacuum Electronics Conference (IVEC);2023-04-25
2. Tip-based nanolithography methods and materials;Materials and Processes for Next Generation Lithography;2016