A framework for testing special-purpose memories
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Published:2002-12
Issue:12
Volume:21
Page:1459-1468
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ISSN:0278-0070
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Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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language:en
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Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
Author:
Sidorowicz P.R.,Brzozowski J.A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
1 articles.
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1. Memory Test;Integrated Circuit Test Engineering