Corrections to “Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices”
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Published:2004-04
Issue:4
Volume:23
Page:581-582
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ISSN:0278-0070
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Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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language:en
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Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
Author:
Thalhammer R.,Wachutka G.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software