Author:
Roy Soham,Millican Spencer K.,Agrawal Vishwani D.
Cited by
11 articles.
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1. A High Performance PODEM Algorithm with the Improved Backtrace Process;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18
2. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
3. Deep Reinforcement Learning-Based Automatic Test Pattern Generation;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17
4. HybMT: Hybrid Meta-Predictor based ML Algorithm for Fast Test Vector Generation;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22
5. An Amalgamated Testability Measure Derived from Machine Intelligence;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06