Transaction-based debugging of system-on-chips with patterns
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5406656/5413104/05413157.pdf?arnumber=5413157
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Enhancing Network-on-Chip Performance by Reusing Trace Buffers;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-04
2. Enhancing Observability for Post-Silicon Debug with On-chip Communication Monitors;2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2018-07
3. Post Silicon Debugging of Electrical Bugs Using Trace Buffers;2017 IEEE 26th Asian Test Symposium (ATS);2017-11
4. Managing Trace Summaries to Minimize Stalls During Postsilicon Validation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-06
5. Transaction-based online debug for NoC-based multiprocessor SoCs;Microprocessors and Microsystems;2015-05
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