Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
23 articles.
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1. Statistische Grundlagen;Statistische Unsicherheit in der industriellen Produktion;2022
2. Statistical Inference as Severe Testing;2018-09-14
3. Inference in the age of big data: Future perspectives on neuroscience;NeuroImage;2017-07
4. O’Hagan, A., Buck, C.E., Daneshkhah, A., Eiser, J.R., Garthwaite, P.H., Jenkinson, D.J., Oakley, J.E., & Rakow, T. (2006). Uncertain judgements: Eliciting experts’ probabilities. Hoboken, NJ: Wiley. xiii+321 pp. US$75.00. ISBN: 978-0-470-02999-2.;Psychometrika;2007-10-06
5. Index;Statistical Inference as Severe Testing