Author:
Tanaka Musashi,Yoshida Takahiro
Cited by
4 articles.
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1. Characteristics of a Long Duration Noise Induced on a Wearable Devices by Potential Drop of a Charged Proximity Object Caused by ESD;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20
2. Malfunction of a Wearable Device Caused by Potential Drop of a Charged Proximity Object due to Electrostatic Discharge;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20
3. Design for EMI Immunity and ESD Protection for Wearable and Flexible ICs (Invited);2023 IEEE 15th International Conference on ASIC (ASICON);2023-10-24
4. Design for EMI/ESD Immunity for Flexible and Wearable Electronics;IEEE Journal of the Electron Devices Society;2023