Effects of Crack Faults on the Dynamics of Piezoelectric Cantilever-Based MEMS Sensor
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/7361/8030198/08003461.pdf?arnumber=8003461
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Diagnostics of Piezoelectric Bending Actuators Subjected to Varying Operating Conditions;Electronics;2024-01-27
2. Design and Experimental Evaluation of a Dual-Cantilever Piezoelectric Film Sensor with a Broadband Response and High Sensitivity;Micromachines;2023-11-17
3. A Self-Test Method of Structural Failures of Uncooled Infrared Focal Plane Array;IEEE Transactions on Semiconductor Manufacturing;2021-08
4. Comparative investigations of multi-fidelity modeling on performance of electrostatically-actuated cracked micro-beams;International Journal of Mechanical Sciences;2021-02
5. Nonlinear modeling and performance analysis of cracked beam microgyroscopes;International Journal of Mechanical Sciences;2020-12
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