Complex Permittivity and Uncertainty Evaluations for an Ultrathin Photosensitive Insulator Film Using a Millimeter Wave Circular Cavity Resonator
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9661585/9661586/09661632.pdf?arnumber=9661632
Reference8 articles.
1. Permittivity characterization of low-k thin films from transmission-line measurements
2. Accurate Evaluation Technique of Complex Permittivity for Low-Permittivity Dielectric Films Using a Cavity Resonator Method in 60-GHz Band
3. Measurement methods for the permittivity of thin sheet dielectric materials
4. Development of the measurement method of dielectric constant of low-k film in the millimeter wave region
5. Evaluation of measurement data - Guide to the expression of uncertainty in measurement;JCGM,2008
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