Predictive Simulation and Benchmarking of Si and Ge pMOS FinFETs for Future CMOS Technology-Reference-Cited by-同舟云学术

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Predictive Simulation and Benchmarking of Si and Ge pMOS FinFETs for Future CMOS Technology

Published:2014-07 Issue:7 Volume:61 Page:2271-2277
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/6837542/06832528.pdf?arnumber=6832528

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