Characterization and Modeling of Multiple Coupled Inductors Based on On-Chip Four-Port Measurement-Reference-Cited by-全球学者库

Characterization and Modeling of Multiple Coupled Inductors Based on On-Chip Four-Port Measurement

Published:2014-10 Issue:10 Volume:4 Page:1696-1704
ISSN:2156-3950
Container-title:IEEE Transactions on Components, Packaging and Manufacturing Technology
language:
Short-container-title:IEEE Trans. Compon., Packag. Manufact. Technol.

Author:

Kang Kai,Zong Zhirui,Gao Zongzhi,Ban Yong-Ling,Staszewski Bogdan,Yin Wen-Yan

Funder

National Natural Science Foundation of China

National Basic Research Program of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials

Link

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