An Adaptive Sampling Process for Automated Multivariate Macromodeling Based on Hamiltonian-Based Passivity Metrics

Author:

Fevola ElisaORCID,Zanco AlessandroORCID,Grivet-Talocia StefanoORCID,Bradde TommasoORCID,De Stefano MarcoORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Auto-Labeling for Pattern Recognition of Wafer Defect Maps in Semiconductor Manufacturing;Journal of Manufacturing Science and Engineering;2024-04-22

2. Fast Stochastic Surrogate Modeling via Rational Polynomial Chaos Expansions and Principal Component Analysis;IEEE Access;2021

3. Uniformly Stable Parameterized Macromodeling Through Positive Definite Basis Functions;IEEE Transactions on Components, Packaging and Manufacturing Technology;2020-11

4. A mesh-free adaptive parametric macromodeling strategy with guaranteed stability;2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE;2020-09-23

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