Analysis of Interfacial Peeling of an Ultrathin Silicon Wafer Chip in a Pick-Up Process Using an Air Blowing Method

Author:

Jeon Eun-Beom,Park Sung-Hyeon,Yoo Yun-Sik,Kim Hak-SungORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Plasma dicing before grinding process for highly reliable singulation of low-profile and large die sizes in advanced packages;Micro and Nano Systems Letters;2023-11-18

2. Anti-Overturning Mechanism and Control Strategy In High-Speed Die Peeling-off Process;Proceedings of the 2023 6th International Conference on Robot Systems and Applications;2023-09-22

3. Dynamic peeling process of IC chip from substrate based on a 3D analytical model;International Journal of Solids and Structures;2023-09

4. Coupled Excitation Strategy for Crack Initiation at the Adhesive Interface of Large-Sized Ultra-Thin Chips;Processes;2023-05-26

5. Development of a Flexure Mechanism for Thin Die Pick-up Process;2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO);2022-08-08

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