A Composite Probe With Parasitic Elements for Improving Sensitivity and Simultaneously Measuring Electric and Magnetic Fields-Reference-Cited by-同舟云学术

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A Composite Probe With Parasitic Elements for Improving Sensitivity and Simultaneously Measuring Electric and Magnetic Fields

Published:2024-05 Issue:5 Volume:14 Page:872-879
ISSN:2156-3950
Container-title:IEEE Transactions on Components, Packaging and Manufacturing Technology
language:
Short-container-title:IEEE Trans. Compon., Packag. Manufact. Technol.

Author:

Wang Lei¹^ORCID,Zhou Rong²^ORCID,Liu Xiaoxian²^ORCID,Zhu Zhangming²^ORCID

Affiliation:

1. Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, CEPREI, Guangzhou, China

2. Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), Xidian University, Xi’an, Shaanxi, China

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/5503870/10538069/10493075.pdf?arnumber=10493075

Reference28 articles.

1. Controlling Chaos in a Memristor Based Circuit Using a Twin-T Notch Filter

2. Adaptive Multi-Band Negative-Group-Delay RF Circuits With Low Reflection

3. Miniaturized Resonator and Bandpass Filter for Silicon-Based Monolithic Microwave and Millimeter-Wave Integrated Circuits

4. Some Properties of Multiple-Antenna-Port and Multiple-User-Port Antenna Tuners

5. Highly-Isolated RF Power and Information Receiving System Based on Dual-Band Dual-Circular-Polarized Shared-Aperture Antenna

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A New Low Profile Differential Magnetic Probe With Enhanced Sensitivity;IEEE Sensors Journal;2024-07-15

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