High-Frequency Characterization and Modeling of Coaxial Connectors With Degraded Contact Surfaces

Author:

Ji RuiORCID,Flowers George T.,Gao Jinchun,Cheng Zhongyang,Xie Gang

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials

Cited by 26 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Solder joint shape optimization and thermal-mechanical reliability improvement for microwave RF coaxial connectors;Microelectronics Reliability;2024-03

2. Effects of Coaxial Connector Deformation on Digital Signal Waveform;2023 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP);2023-11-13

3. Impact of Electrical Contacts Degradation on High-Speed Digital Signal Transmission;2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC);2023-10-20

4. The Impact of Electrical Contact Degradation of Conductive Foam on Near-field Radiation;2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM);2023-10-04

5. Cable-Aided Distributed Reconfigurable Intelligent Surface (CRIS): New Paradigm for Wireless Communication Networks;IEEE Communications Magazine;2023-03

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