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Monitoring and Suppression of the Typical Hot-Spot Phenomenon Resulting From Low-Resistance Defects in a PV String

  • Published:2018-11 Issue:6 Volume:8 Page:1809-1817
  • ISSN:2156-3381
  • Container-title:IEEE Journal of Photovoltaics
  • language:
  • Short-container-title:IEEE J. Photovoltaics

Author:

Yang ShuaiORCID,Itako Kazutaka,Kudoh TsugutomoORCID,Koh KeishinORCID,Ge Qiang

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Hot Spot Identification Approach for Photovoltaic Module Based on Enhanced U-Net With Squeeze-and-Excitation and VGG19;IEEE Transactions on Instrumentation and Measurement;2024

2. Simulated Characteristics of a PV Module with Low-Resistance Defects;2023 13th International Conference on Power, Energy and Electrical Engineering (CPEEE);2023-02-25

3. Real-Time Anticipation and Prevention of Hot Spots by Monitoring the Dynamic Conductance of Photovoltaic Panels;IEEE Journal of Photovoltaics;2022-07

4. Decentralized Suppression Strategy of Common Ground Circulating Current Caused by Grounding Fault in PV Modules in Single-Phase PV Grid-Connected Systems;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2022-03

5. Development of Active PV Array Using Real-Time Scanning Method;IOP Conference Series: Earth and Environmental Science;2021-06-01
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