Differences in Printed Contacts Lead to Susceptibility of Silicon Cells to Series Resistance Degradation
Author:
Affiliation:
1. National Renewable Energy Laboratory, Golden, CO, USA
2. Core Energy Works, Newark, DE, USA
3. Luminace, New York, NY, USA
Funder
Alliance for Sustainable Energy, LLC
National Renewable Energy Laboratory
U.S. Department of Energy
Office of Energy Efficiency and Renewable Energy
Solar Energy Technologies Office
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
https://ieeexplore.ieee.org/ielam/5503869/9760484/9731801-aam.pdf
Reference18 articles.
1. Permeation impact on metallization degradation
2. Finger and interconnect degradations in crystalline silicon photovoltaic modules: A review
3. Multiscale Characterization of Photovoltaic Modules—Case Studies of Contact and Interconnect Degradation
4. Characterization of front contact degradation in monocrystalline and multicrystalline silicon photovoltaic modules following damp heat exposure
5. Investigation of Degradation Mode Spreading Interconnectors by Pressure-Cooker Testing of Photovoltaic Cells
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