Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction-Reference-Cited by-同舟云学术

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Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction

Published:2015-12-01 Issue:12 Volume:64 Page:3417-3429
ISSN:0018-9340
Container-title:IEEE Transactions on Computers
language:
Short-container-title:IEEE Trans. Comput.

Author:

Chen Linfeng,Cui Aijiao,Chang Chip-Hong

Funder

Shenzhen Foundamental Science Research Foundation

SRF

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx7/12/7313054/07035036.pdf?arnumber=7035036

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