Inference From Lumen Degradation Data Under Wiener Diffusion Process-Reference-Cited by-同舟云学术

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Inference From Lumen Degradation Data Under Wiener Diffusion Process

Published:2012-09 Issue:3 Volume:61 Page:710-718
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Tzong-Ru Tsai ,Chin-Wei Lin ,Yi-Ling Sung ,Pei-Ting Chou ,Chiu-Ling Chen ,Yuhlong Lio

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx5/24/6289428/06239641.pdf?arnumber=6239641

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