Effects of annealing on the structural and optical properties of sputtered SiC/Ag/SiC multilayer
Author:
Affiliation:
1. University of Larbi Ben M’hidi, Oum El Bouaghi,ISTA,Oum El Bouaghi,Algeria
2. University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9975828/9975804/09975902.pdf?arnumber=9975902
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1. Self-powered photodetectors based on β-Ga2O3/4H–SiC heterojunction with ultrahigh current on/off ratio and fast response
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3. High-Responsivity MSM Solar-Blind UV Photodetector Based on Annealed ITO/Ag/ITO Structure Using RF Sputtering
4. Influence of Al/Cu thickness ratio and deposition sequence on photoelectric property of ZnO/Al/Cu/ZnO multilayer film on PET substrate prepared by RF magnetron sputtering
5. Probing the highly transparent and conducting SnOx/Au/SnOx structure for futuristic TCO applications
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1. Studies on Structural and Electrical Characterization of Nitrogen Doped SiC Thin Films;2024 International Conference on Smart Systems for applications in Electrical Sciences (ICSSES);2024-05-03
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