2D NIR-SPI spatial resolution evaluation under scattering condition-Reference-Cited by-同舟云学术

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2D NIR-SPI spatial resolution evaluation under scattering condition

Published:2022-11-09 Issue: Volume: Page:
ISSN:
Container-title:2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)
language:
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Author:

Quero Carlos Alexander Osorio¹,Durini Daniel¹,Rangel-Magdaleno Jose de Jesus¹,Martinez-Carranza Jose²,Ramos-Garcia Ruben³

Affiliation:

1. Instituto Nacional de Astrofísica, Óptica y Electrónica (INAOE),Electronics Department,Puebla,Mexico

2. Instituto Nacional de Astrofísica Óptica y Electrónica (INAOE),Computer Science Department,Puebla,Mexico

3. Instituto Nacional de Astrofísica Óptica y Electrónica (INAOE),Optical Department,Puebla,Mexico

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9975828/9975804/09975875.pdf?arnumber=9975875

Reference28 articles.

1. Measurement of Non-Circular PSFs in Single Pixel Cameras

2. The Evaluation of Single-Pixel Camera Resolution

3. Evaluating the accuracy of point spread function deconvolutions applied to luminescence images

4. Modeling and measurement of image sensor characteristics;fliegel;Radioengineering,2004

5. Choice of spatial resolution measurement methods to implement

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