JICG MOS transistors for reduction of radiation effects in CMOS electronics-Reference-Cited by-同舟云学术

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JICG MOS transistors for reduction of radiation effects in CMOS electronics

Published:2018-01 Issue: Volume: Page:
ISSN:
Container-title:2018 IEEE Topical Workshop on Internet of Space (TWIOS)
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Author:

Sorge R.,Schmidt J.,Wipf Ch.,Reimer F.,Pliquett R.,Mausolf Th.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8304876/8311386/08311401.pdf?arnumber=8311401

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical Fault Injection Attacks against Radiation-Hard Shift Registers;2021 24th Euromicro Conference on Digital System Design (DSD);2021-09

2. Leakage Currents Automated Monitoring System for Memory ICs under Dose Exposure;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13

3. Fast-Transient Radiation-Hardened Low-Dropout Voltage Regulator for Space Applications;IEEE Transactions on Nuclear Science;2021-05

4. Methods for Increasing the Speed of the Analog Interfaces for Physical Quantity Sensors Based on Radiation-Hardened and Low-Temperature Technologies;Journal of Physics: Conference Series;2020-01-01

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