Analysis of Weibull Step-Stress Model In Presence of Competing Risk
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx7/24/8727549/08671733.pdf?arnumber=8671733
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1. Inference of multi‐sample stage life testing model under Weibull distribution;Quality and Reliability Engineering International;2024-08-22
2. Inferences on the Generalized Inverted Exponential Distribution in Constant Stress Partially Accelerated Life Tests Using Generally Progressively Type-II Censored Samples;Applied Sciences;2024-07-11
3. Reliability estimation of s -out-of- k system with Kumaraswamy distribution based on partially constant stress accelerated life tests;Statistical Theory and Related Fields;2024-06-05
4. Tampered Random Variable Analysis in Step-Stress Testing: Modeling, Inference, and Applications;Mathematics;2024-04-20
5. Maximum Product of Spacings Estimator Under Type-I Censoring With an Application to a Step-Stress Model With Weibull Lifetimes;IEEE Transactions on Reliability;2024
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