Author:
Mandic I.,Cindro V.,Dolenc I.,Gorisek A.,Kramberger G.,Mikuz M.,Hartert J.,Bronner J.,Franz S.
Cited by
1 articles.
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1. Analysis of displacement damage effects on MOS capacitors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2013-12