NIST comparison of the quantized Hall resistance and the realization of the SI OHM through the calculable capacitor-Reference-Cited by-同舟云学术

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NIST comparison of the quantized Hall resistance and the realization of the SI OHM through the calculable capacitor

Published:1997-04 Issue:2 Volume:46 Page:264-268
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Jeffery A.-M.,Elmquist R.E.,Lee L.H.,Shields J.Q.,Dziuba R.F.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx1/19/12386/00571828.pdf?arnumber=571828

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