On-Chip Millimeter-Wave Cold-Source Noise Figure Measurements With PNA-X-Reference-Cited by-同舟云学术

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On-Chip Millimeter-Wave Cold-Source Noise Figure Measurements With PNA-X

Published:2017-12 Issue:12 Volume:66 Page:3399-3401
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Pepe Domenico^ORCID,Barnett Clive,D'Amore Giovanni,Zito Domenico^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/8089055/08052212.pdf?arnumber=8052212

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