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High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture

  • Published:2017-09 Issue:9 Volume:66 Page:2422-2427
  • ISSN:0018-9456
  • Container-title:IEEE Transactions on Instrumentation and Measurement
  • language:
  • Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Bogle Andrew E.,Hyde Milo W.,Havrilla Michael J.,Sovern Jeffrey S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

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