Author:
Shang Yang,Shinohara Makoto,Qiu Wen,Zee Bernice
Cited by
2 articles.
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1. A preliminary study on the Soft Defects Modeling and Measurement Method using Time-domain Reflectometry;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24
2. Time-Domain Reflectometry Analysis on Low Impedance Marginal Failure and multi-chip Modules;2022 IEEE 24th Electronics Packaging Technology Conference (EPTC);2022-12-07