Image Reconstruction Using Interval Simulated Annealing in Electrical Impedance Tomography-Reference-Cited by-同舟云学术

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Image Reconstruction Using Interval Simulated Annealing in Electrical Impedance Tomography

Published:2012-07 Issue:7 Volume:59 Page:1861-1870
ISSN:0018-9294
Container-title:IEEE Transactions on Biomedical Engineering
language:
Short-container-title:IEEE Trans. Biomed. Eng.

Author:

de Castro Martins Thiago,Bueno de Camargo Erick Dario León,Gonzalez Lima Raul,Amato Marcelo Britto Passos,de Sales Guerra Tsuzuki Marcos

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Biomedical Engineering

Link

http://xplorestaging.ieee.org/ielx5/10/6218186/06156424.pdf?arnumber=6156424

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