Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
24 articles.
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1. SBanTEM: A Novel Methodology for Sparse Band Tensors as Soft-Error Mitigation in Sparse Convolutional Neural Networks;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-07
3. Implicit Memory Tagging: No-Overhead Memory Safety Using Alias-Free Tagged ECC;Proceedings of the 50th Annual International Symposium on Computer Architecture;2023-06-17
4. Compiler-Implemented Differential Checksums: Effective Detection and Correction of Transient and Permanent Memory Errors;2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN);2023-06
5. Towards Transient Fault Mitigation Techniques Optimized for Compressed Neural Networks;2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S);2023-06