Long-Term Reliability Evaluation on Single-Phase Immersion Cooling-Based Server with Electronic Fluorinated Liquid-Reference-Cited by-同舟云学术

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Long-Term Reliability Evaluation on Single-Phase Immersion Cooling-Based Server with Electronic Fluorinated Liquid

Published:2023-05 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
language:
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Author:

Zhong Yangfan¹,Liu Dan¹,Wen Fangzhi¹,Guo Rui¹,Bao Tina²,Wang Kai²,Gong Haifeng²,Fang Haibin¹,Li Xiaopeng¹,He Yongbao¹,Lian Heng¹,Xiang Bei¹

Affiliation:

1. Alibaba, Inc.

2. Intel, Inc

Funder

National Key Research and Development Program of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10195193/10195244/10195454.pdf?arnumber=10195454

Reference20 articles.

1. Moisture, Myths, and Microcircuits

2. Dust test results on multicontact circuit board connectors

3. Dust Corrosion;lin;Proc 50th IEEE Holm Conf Electrical Contact,2004

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comprehensive review and future prospects on chip-scale thermal management: Core of data center’s thermal management;Applied Thermal Engineering;2024-08

2. Long-Term Reliability Analysis of Crystal Oscillator under Immersion Cooling with Various Coolants;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

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