HIER: Metric Learning Beyond Class Labels via Hierarchical Regularization

Author:

Kim Sungyeon1,Jeong Boseung1,Kwak Suha1

Affiliation:

1. POSTECH,Dept. of CSE

Publisher

IEEE

Reference55 articles.

1. Deep metric learning with hierarchical triplet loss;ge;Proc European Conference on Computer Vision (ECCV),2018

2. Cur-vature generation in curved spaces for few-shot learning;gao;Proc IEEE International Conference on Computer Vision (ICCV),2021

3. Batch normalization: Accelerating deep network training by reducing internal co-variate shift;ioffe;Proc International Conference on Machine Learning (ICML),2015

4. Deep Residual Learning for Image Recognition

5. Learning to compare image patches via convolutional neural networks

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1. Anchor-aware Deep Metric Learning for Audio-visual Retrieval;Proceedings of the 2024 International Conference on Multimedia Retrieval;2024-05-30

2. Hyperbolic Deep Learning in Computer Vision: A Survey;International Journal of Computer Vision;2024-03-26

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