Polarimetric iToF: Measuring High-Fidelity Depth Through Scattering Media-Reference-Cited by-同舟云学术

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Polarimetric iToF: Measuring High-Fidelity Depth Through Scattering Media

Published:2023-06 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
language:
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Author:

Jeon Daniel S.¹,Meuleman Andréas¹,Baek Seung-Hwan²,Kim Min H.¹

Affiliation:

1. KAIST

2. POSTECH

Funder

Samsung Electronics

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10203037/10203050/10204964.pdf?arnumber=10204964

Reference41 articles.

1. Improvement Of Underwater Visibility By Reduction Of Backscatter With A Circular Polarization Technique

2. Active Polarization Descattering

3. Vision meets robotics: The KITTI dataset

4. Deep End-to-End Time-of-Flight Imaging

5. Phasor Imaging

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Passive Polarized Vision for Autonomous Vehicles: A Review;Sensors;2024-05-22

2. Underwater dynamic polarization imaging without dependence on the background region;Optics Express;2024-01-31

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