Author:
Zhuo Zhang ,Reddy S.M.,Pomeranz I.
Cited by
43 articles.
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1. Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-04
2. Functional Test Sequences as a Source for Partially Functional Launch-on-Shift Tests;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-11
3. Covering Test Holes of Functional Broadside Tests;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
4. Intelligent design automation for 2.5/3D heterogeneous SoC integration;Proceedings of the 39th International Conference on Computer-Aided Design;2020-11-02
5. Functional Broadside Tests Under Broadcast Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10