Why and How ITRS Worked to Recover the Breakdown of “Scaling Law” in 2000s—Structural Frame Analysis of Si-CMOS Semiconductor Technologies-Reference-Cited by-同舟云学术

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Why and How ITRS Worked to Recover the Breakdown of “Scaling Law” in 2000s—Structural Frame Analysis of Si-CMOS Semiconductor Technologies

Published:2021-08 Issue:4 Volume:68 Page:1179-1194
ISSN:0018-9391
Container-title:IEEE Transactions on Engineering Management
language:
Short-container-title:IEEE Trans. Eng. Manage.

Author:

Yasunaga Yuko^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Strategy and Management

Link

http://xplorestaging.ieee.org/ielx7/17/9437272/09210127.pdf?arnumber=9210127

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