Fabrication of Stacked CMOS Image Sensor With NiO/Ga2O3 UV Photoconversion Films Using Low-Oxygen RF-Sputtered NiO for Transparent Image Sensor
Author:
Affiliation:
1. NHK Science & Technology Research Laboratories, Japan Broadcasting Corporation, Tokyo, Japan
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/7782634/10129999/10123129.pdf?arnumber=10123129
Reference30 articles.
1. Electrical properties of ZnO:H films fabricated by RF sputtering deposition and fabrication of p-NiO/n-ZnO heterojunction devices
2. Optical Absorption and Photoconductivity in the Band Edge ofβ−Ga2O3
3. High-quality β-Ga2O3single crystals grown by edge-defined film-fed growth
4. Electrical properties of undoped and Li-doped NiO thin films deposited by RF sputtering without intentional heating
5. Crystalline Selenium Layer Stacked Image Sensors With Pixel-Parallel A/D Converters Toward Photon Counting
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