Impact of Scaling Up the Sensor Sampling Frequency on the Reliability of Edge Processing Systems in Tolerating Soft Errors Caused by Neutrons
Author:
Affiliation:
1. Institut Polytechnique de Paris, IMT, Telecom Paris, LTCI, Palaiseau, France
2. Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA, Grenoble, France
3. Institut Laue-Langevin, Grenoble, France
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx8/7782634/10631276/10614826.pdf?arnumber=10614826
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4. Measurement and reporting of alpha particle and terrestrial cosmic ray induced soft errors in semiconductor devices,2021
5. Current and Future Challenges in Radiation Effects on CMOS Electronics
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