A Liquid Film Thickness Measurement Scheme Using a Multielectrode Conductivity Compensation Method-Reference-Cited by-同舟云学术

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A Liquid Film Thickness Measurement Scheme Using a Multielectrode Conductivity Compensation Method

Published:2024-03 Issue:3 Volume:8 Page:1-4
ISSN:2475-1472
Container-title:IEEE Sensors Letters
language:
Short-container-title:IEEE Sens. Lett.

Author:

Mandal Souvik¹^ORCID,Das Prasanta Kumar²^ORCID,Biswas Karabi³^ORCID

Affiliation:

1. Advanced Technology Development Center, Indian Institute of Technology Kharagpur, Kharagpur, WB, India

2. Department of Mechanical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, WB, India

3. Department of Electrical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, WB, India

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/7782634/10423169/10436331.pdf?arnumber=10436331

Reference10 articles.

1. A method for direct thickness measurement of wavy liquid film in gas-liquid two-phase annular flow using conductance probes

2. Capacitive determination of wall-film thickness in liquid-liquid slug flow and its application as a non-invasive microfluidic viscosity sensor

3. Reconstruction of Taylor Bubbles in Slug Flow Using a Direct-Image Multielectrode Conductance Sensor

4. Measurement of Liquid Film Thickness in Vertical Multiphase Slug and Churn Flows Using Distributed Ultrasonic Method

5. Analytical estimation of liquid film thickness in two-phase annular flow using electrical resistance measurement

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