THz Vector Field Measurement Comparison Between On-the-Fly and Step Scan Method-Reference-Cited by-同舟云学术

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THz Vector Field Measurement Comparison Between On-the-Fly and Step Scan Method

Published:2016 Issue: Volume: Page:1-9
ISSN:2156-342X
Container-title:IEEE Transactions on Terahertz Science and Technology
language:
Short-container-title:IEEE Trans. THz Sci. Technol.

Author:

Hu Jie,Lou Zheng,Yao Qi-Jun,Miao Wei,Yang Jin-Ping,Lin Zhen-Hui,Shi Sheng-Cai

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Radiation

Link

http://xplorestaging.ieee.org/ielx7/5503871/5741778/07797489.pdf?arnumber=7797489

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Single-probe Near-field Phase Retrieval using On-The-Fly Scan and Hilbert Transform;2023 International Symposium on Electromagnetic Compatibility – EMC Europe;2023-09-04

2. Design, Uncertainty Analysis and Measurement of a Silicon-based Platelet THz Corrugated Horn;IEEE Transactions on Antennas and Propagation;2021

3. Design and characterization of a W‐band wide‐beam horn for radio holography;Microwave and Optical Technology Letters;2020-08-24

4. Low-Loss, Thermally Insulating, and Flexible Rectangular Dielectric Waveguide for Sub-THz—Signal Coupling in Superconducting Receivers;IEEE Transactions on Terahertz Science and Technology;2020-03

5. Near-Field Radio Holography of Slant-Axis Terahertz Antennas;IEEE Transactions on Terahertz Science and Technology;2020-03

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