Measurement of Silicon Micromachined Waveguide Components at 500–750 GHz-Reference-Cited by-同舟云学术

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Measurement of Silicon Micromachined Waveguide Components at 500–750 GHz

Published:2014-01 Issue:1 Volume:4 Page:33-38
ISSN:2156-342X
Container-title:IEEE Transactions on Terahertz Science and Technology
language:
Short-container-title:IEEE Trans. THz Sci. Technol.

Author:

Reck Theodore J.,Jung-Kubiak Cecile,Gill John,Chattopadhyay Goutam

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Radiation

Link

http://xplorestaging.ieee.org/ielx7/5503871/6716106/06617668.pdf?arnumber=6617668

Cited by 52 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A 220–260-GHz Silicon-Micromachined Waveguide MEMS Crossover Switch;IEEE Transactions on Microwave Theory and Techniques;2024-09

2. Terahertz Extreme Skin-Depth Waveguides;IEEE Transactions on Terahertz Science and Technology;2024-09

3. A High-Performance 220–290 GHz Micromachined Waveguide Switch Based on Interference Between MEMS Reconfigurable Surfaces;IEEE Transactions on Terahertz Science and Technology;2024-03

4. A CPW Probe to Rectangular Waveguide Transition for On-Wafer Micromachined Waveguide Characterization;IEEE Transactions on Terahertz Science and Technology;2024-01

5. A Transmit Lens Array With High-Gain and Beam-Steering Capabilities at Submillimeter Wavelengths;IEEE Transactions on Terahertz Science and Technology;2024-01

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