A Non-Contact Submillimeter-Wave $S$-Parameters Measurement Technique for Multiport Micromachined Devices-Reference-Cited by-同舟云学术

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A Non-Contact Submillimeter-Wave $S$-Parameters Measurement Technique for Multiport Micromachined Devices

Published:2014-05 Issue:3 Volume:4 Page:338-346
ISSN:2156-342X
Container-title:IEEE Transactions on Terahertz Science and Technology
language:
Short-container-title:IEEE Trans. THz Sci. Technol.

Author:

Moallem Meysam,Sarabandi Kamal

Funder

Army Research Laboratory

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Radiation

Link

http://xplorestaging.ieee.org/ielx7/5503871/6807840/06775309.pdf?arnumber=6775309

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. A W-Band GSG Probe Fabricated by Metal Additive Manufacturing;IEEE Transactions on Instrumentation and Measurement;2022

3. Silicon Probe Measurement and Characterization in Sub-THz Range;IEEE Transactions on Terahertz Science and Technology;2020-11

4. A Sub-THz Rectangular Waveguide Phase Shifter Using Piezoelectric-Based Tunable Artificial Magnetic Conductor;IEEE Transactions on Terahertz Science and Technology;2018-11

5. Determination of Propagation Constant of Terahertz Dielectric Ridge Waveguide Using Noncontact Measurement Approach;IEEE Transactions on Instrumentation and Measurement;2017-08

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