Correlation of Direct Current Injection (DCI) and Free-Field Illumination for HIRF Certification

Author:

Rasek Guido A.,Loos Steffen E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Direct Current Mode Stirred, a Road Map to a New EMC Standard;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20

2. A Digital-Model-Based Approach for Defining HIRF Immunity Design Requirements of Commercial Aircraft Engine Control Systems;IEEE Access;2024

3. Statistical Inference of Electric Fields in Lossy Reverberating Environments Subject to High Intensity Radiated Field and Direct Current Injection;2023 International Symposium on Electromagnetic Compatibility – EMC Europe;2023-09-04

4. Direct Current Mode Stirred –Susceptibility Testing Results of a small EUT and Comparison to RC and SAC Results;2023 International Symposium on Electromagnetic Compatibility – EMC Europe;2023-09-04

5. Validation of Lightning Simulation Compared With Measurements Using DCI Technique Post-Processed to be Applied to a Lightning Threat;IEEE Transactions on Electromagnetic Compatibility;2023-02

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