Dielectric Function of VO<sub>2</sub> determined by Spectroscopic Ellipsometry-Reference-Cited by-同舟云学术

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Dielectric Function of VO₂ determined by Spectroscopic Ellipsometry

Published:2023-09 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Research and Applications of Photonics in Defense Conference (RAPID)
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Author:

Louisos Dustin¹,McLamb Micheal¹,Ginn James²,Warren Andrew P.²,Boreman Glenn D.¹,Mencagli Mario Junior³,Willis Andrew³,Hofmann Tino¹,Touma Jimmy E.⁴

Affiliation:

1. University of North Carolina at Charlotte,Dept. of Physics and Optical Science,Charlotte,NC,USA,28025

2. Plasmonics Inc,Orlando,FL,USA,32826

3. University of North Carolina at Charlotte,Electrical and Computer Engineering Dept.,Charlotte,NC,USA,28025

4. Air Force Research Laboratory,Eglin AFB,FL,USA,32542

Funder

NSF

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10264698/10264706/10264735.pdf?arnumber=10264735

Reference11 articles.

1. Quick Switch: Strongly Correlated Electronic Phase Transition Systems for Cutting-Edge Microwave Devices

2. Thermal hysteresis measurement of the VO2 dielectric function for its metal-insulator transition by visible-IR ellipsometry

3. Electrical and optical properties of VO2 thin films ghrown on various sapphire substrates by using RF sputtering deposition;jung;IEEE,2016

4. On the Optical Properties of Thin‐Film Vanadium Dioxide from the Visible to the Far Infrared

5. Four-dimensional ultrafast elecrton microscopy of phase transitions;grinolds;Proc Natl Acad Sci,0

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